Definition
Plain language
The slow shifting of metal atoms inside a wire when a strong current pushes them along.
As stated in the literature
Current-induced mass transport in conductors caused by momentum exchange between charge carriers and lattice atoms; a dominant failure mode in fine interconnects.
Why it matters: It sets a hard physical limit on how small and how heavily loaded circuit wiring can be before it wears out.
For example, a chip's tiny metal wire can develop a gap after months of heavy current because atoms have literally been nudged out of place.
Heard on the show
“The whole design strips signature terminology out of the preambles — "electromigration" becomes plain "migration," so the term can be used as a recall target instead.”Episode 240 — Frontier Models Designed Follow-Ups To Fraudulent Papers 93% Of The Time